(MAPLD Conference)
C2: Rocky Koga
Aerospace Corp.
"SEFI IN EEPROM"
We have found Single Event Functional Interrupts (SEFIs) in EEPROMs (electrically erasable programmable read only memories). Since this class of device is read more often than written in most applications, we have attempted to measure the SEE sensitivities during the read process. During the read process, an EEPROM functions very similarly to a RAM. While reading, we have found incidences in which the control logic of the device appears to upset, in addition to the usual bit errors in the output. When this takes place, the normal EEPROM function ceases, yielding an unusual data output pattern. At this point we normally declare that we have observed a SEFI. Two different types of functional interrupt were observed.
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Last Revised: July 03, 2002
Digital Engineering Institute
Web Grunt: Richard Katz
