(MAPLD Conference)
C1: J. J. Wang, B.
Cronquist, J. McCollum, Actel Corp. D. Patel, and R. Katz,
Actel Corp, Lockheed-Martin Federal Systems, and NASA/Goddard Space Flight Center
"Development of Total Dose Hardened Antifuse FPGA"
The product development of a total dose hardened, QML antifuse field programmable gate array (FPGA) is presented. A commercial design, A1020B, is processed by a hardened process to meet most space radiation total dose requirements. Significant modification of the device, process and circuit design was done to optimize the wafer yield, programmability, and single event effects (SEEs). Key product differences between the commercial and rad-hard version are compared. Extensive single event upset (SEU) tests were performed to study the sensitivity of the clock circuit. Special DUT (device under test) design to count the upset rates due to clock circuit was implemented. SEU rates simulation were also done for a typical geostationary orbit to evaluate the upsets due to the clock circuit.
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Last Revised: July 03, 2002
Digital Engineering Institute
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