Soft Error Rate of FLASH based FPGA in Terrestrial Environments

JJ Wang¹, B. Cronquist¹, J. McCollum¹, R. Katz², I. Kleyner³

¹ Actel Corporation
² NASA Office of Logic Design
³ Orbital Sciences Corp

 

Abstract

The single event effects (SEE) in a 0.22 µm FLASH-based FPGA are investigated by heavy ion and proton beam testing. Its radiation effects in terrestrial environments are deduced from the test data. The results show that the only SEE is the soft error rate (SER) effect in the user storage devices. Quantitative evaluations of SER at various location and altitude are also presented.