NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

2002 MAPLD Technical Program

Session C. Reliability: Devices and The Effects of the Radiation Environment

Wednesday, September 11, 2002

Session Chairs:
Dr. James W. Howard, Jr. - Jackson and Tull Chartered Engineers
Ken LaBel - NASA Goddard Space Flight Center
Pictures from Session C

September, 11 Memorial.
Dr. John Sommerer
Director, Research and Technology Development
The Johns Hopkins University Applied Physics Laboratory

Paper C1
Merging papers C1A and C1B
Presentation: c1_buchner_s.pdf, c1_buchner_s.ppt
Paper:

Paper C1A
"Single Event Effects Characterization of the AD8151 Digital Cross Point Switch"
Stephen Buchner¹, Paul Marshall², Jim Howard³, Marty Carts⁴, Robert Reed⁵ and Ken LaBel^5
1QSS
²Consultant
³Jackson and Tull
⁴Raytheon
⁵NASA Goddard Space Flight Center
"Stephen P. Buchner" <sbuchner@pop500.gsfc.nasa.gov>
Abstract:  buchner_a.pdf
Abstract: buchner_a.doc

Paper C1B
"Radiation Testing of Two High Speed Communication Networks"
Jim Howard¹, Steve Buchner², Paul Marshall³, Ken LaBel⁴, Hak Kim², Marty Carts⁵, Christina Seidleck⁵, Ron Stattel⁵, Charlie Rogers⁵, and Tim Irwin^2
1 Jackson & Tull Chartered Engineers
² QSS, Inc.
³ Consultant
⁴ NASA Goddard Space Flight Center
⁵ Raytheon ITSS
Abstract: howard1_a.pdf
Abstract: howard1_a.doc

Paper C2
"Single Event effects of 0.15µm Antifuse FPGA"
J. J. Wang¹, B. Cronquist¹, J. McCollum¹, I. Kleyner², and R. Katz^3
1 Actel Corp, Sunnyvale, CA 94085
² Orbital Science Corp, Greenbelt, MD 20771
³ NASA/GSFC, Greenbelt, MD 20771
Abstract: wang_a.pdf,  wang_a.doc
Presentation: c2_wang_s.pdf, c2_wang_s.ppt
Paper:

Talk IE0
"Military, Aerospace, and PLDs: A CEO's View"
John East, President and CEO, Actel Corporation
Pictures of "A CEO's View"

Industrial Exhibits and Break 10:40 - 11:00 am

Paper C3
"Reliability of Programmable Input/Output Pins in the Presence of Configuration Upsets"
Michael Wirthlin¹, Nathan Rollins¹, Michael Caffrey², and Paul Graham^2
1 BYU
² Los Alamos National Laboratory
Abstract: wirthlin_a.pdf
Presentation: c3_wirthlin_s.pdf,  c3_wirthlin_s.ppt
Paper: c3_wirthlin_p.pdf

Paper C4
"Post Programming Burn In (PPBI) for RT54SXS Actel FPGAs"
Dan Elftmann and Minal Sawant
Actel Corporation
Abstract: elftmann_a.pdf,  elftmann_a.doc
Presentation: c4_elftmann_s.pdf, c4_elftmann_s.ppt
Paper: c4_sawant_p.pdf

Paper C5
"Where is 'The Weakest Link?' Aeroflex UTMC’S Reliability Analysis For Antifuse FPGA’S"
Ron Lake
Aeroflex UTMC
Abstract: lake_a.html,  lake_a.pdf,  lake_a.doc
Presentation: c5_lake_s.pdf, c5_lake_s.ppt
Paper:

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