Presentation: C0_Massengill_S_Oral.PDF
Presentation: C0_Massengill_S_Oral.ppt
Single event radiation - once only a niche reliability concern - is now generally accepted to be a critical and wide-spread reliability issue for future-generation commercial integrated circuits. Soft error rate specifications have become common in commercial technology development roadmaps. Commercial integrated circuit manufacturing companies, with no interest in space or military radiation environments, are undertaking single event modeling efforts. This presentation will discuss modeling issues that are emerging as SEE analysis expands from a mission-critical to a commercial-reliability-driven environment.
Prof. Lloyd W. Massengill
Vanderbilt University
B.S. (Electrical Engineering) North Carolina State University, 1982
M.S. (Electrical Engineering) North Carolina State University, 1984
PhD. (Electrical Engineering) North Carolina State University, 1987
Lloyd W. Massengill is Associate Professor of Electrical and Computer Engineering at Vanderbilt University in Nashville TN.
Dr. Massengill’s research is in the area of microelectronic circuit design and modeling for specialty military environments, with a particular emphasis on the modeling of transient radiation effects. He has spent more than 15 years working with various agencies on the analysis of single event and dose rate radiation effects on integrated circuits, the development of circuit models for soft errors, and the development of radiation hardened circuitry for static random access memories (SRAMs), resistive-load memories, and dynamic RAMs. Recently, he has taken a leading role in the U.S. Navy Radiation-Hardened TCAD (Technology Computer-Aided-Design) program, as well as working on the analysis of single event (soft error) charge collection processes in submicron SOI CMOS devices and radiation effects in emerging low power technologies. He is also presently involved in the VHDL modeling of soft error effects in complex sequential logic.
In addition to radiation effects studies, Dr. Massengill has been involved in the design and analysis of specialized analog, digital, and mixed-mode circuits. He hold a U.S. patent on a CMOS analog multiplier circuit based on exponential decay modulation of charge packets. He has also designed novel DRAM and SRAM circuits for noise tolerance and driver circuits for high-voltage piezoelectric actuation. His circuit design specialty is charge-based electronics.
Dr. Massengill served as the 1998 technical program chairman for the IEEE International Nuclear and Space Radiation Effects conference; a conference for which he has also served as session chair, short course speaker, and short course chairman. He has also served as the guest editor for the special NSREC issue of the IEEE Transactions on Nuclear Science, and on the program committees of the Hardened Electronics and Radiation Technology (HEART) Conference, the NASA/Sematech/SRC Symposium on Soft Errors/Radiation Effects/Reliability in VLSI, the NASA Symposium on VLSI Design, and the Academic/Industrial/Defense Workshop on Neural Networks.
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