NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

Low Voltage Dropout Regulators and DC-DC Converters

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Summary:
The aim of this meeting is to outline the ESA needs for DC-DC converters and propose a potential approach for the provision of a series of low cost, readily available OFF the shelf converters that are fully qualified for space use (e.g. for which the usual reliability for space equipments is not compromised). In support of this, and in the frame of the CTB partnership approach, ESA is requesting the industry opinion from the users of DC-DC converters and the manufacturers. Additionally the roundtable is requesting that the space community explore the opportunities of ensuring a sustainable supply by designing a product that would be acceptable to other high reliability users. In addition industry should give an indication of their overall needs for DC-DC converters.

Some Radiation Test Results

Single Event Effects Testing of the HS-117RH Adjustable Voltage Regulator^XL Intersil June 2002	Introduction The intense, heavy ion environment encountered in space applications can cause a variety of effects in electronic circuitry, including single event transient (SET), single event latchup (SEL) and single event burnout (SEB). These single event effects (SEE) can lead to system-level performance issues including degradation, disruption and destruction. For predictable and reliable space system operation, individual electronic components should be characterized to determine their SEE response. This report discusses the results of SEE testing performed on the HS-117RH Adjustable Voltage Regulator.
Single Event Transient and Destructive Testing of the National Semiconductor LM-117 Voltage Regulator Test Date: June 18, 2003	Introduction This study was undertaken to determine the single event destructive and transient susceptibility of the LM-117 Voltage Regulator. The device was monitored for transient interruptions in the output signal and for destructive events induced by exposing it to a heavy ion beam at the Texas A&M University Cyclotron Single Event Effects Test Facility.
MS Kennedy 5920-1.5 LVDO SEE Test	Synopsis: This testing is a preliminary survey of the single event destructive and transient susceptibility of the MSK5920-1.5RH low voltage dropout voltage regulator. The device was monitored for transient interruptions in the output signal and for destructive events induced by exposing it to a heavy ion beam at the Texas A&M University Cyclotron Single Event Effects Test Facility. The sample size of the testing was two devices with a lot date code of 51651. The device is a hybrid device containing 2 active circuits, one bipolar transistor and one bipolar control circuit.
Total Dose Radiation Test Report: MSK 5900RH - Ultra Low Dropout Adjustable Positive Linear Regulator December 20, 2004 B. Erwin and J. Swistak M.S. Kennedy Corporation	Introduction The total dose radiation test plan for the MSK 5900 RH was developed to qualify the device as a radiation tolerant device to 100 KRADS(Si). The testing was performed beyond 100 KRAD to show trends in device performance as a function of total dose. The test does not classify maximum radiation tolerance of the hybrid, but simply offers designers insight to the critical parameter-shifts up to the specified total dose level. MIL-STD-883 Method 1019 and ASTM F1892-98 were used as guidelines in the development and implementation of the total dose test plan for the MSK 5900RH.
Omnirel Low Dropout Regulator OMR185SRM Single Event Transient (SET) and Latchup (SEL) Test Results for the Deep Impact Program July 1, 2002 di_pa_rel_031_omr185.pdf di_pa_rel_031_omr185.doc	*Introduction* The Omnirel Low Dropout Regulator OMR185 is planned for use as a +2.5V bias for the 54SX32S FPGAs on the Deep Impact program. This Omnirel device is a hermetic packaged Linear Technologies LT1085 die. Single Event Transient (SET was identified as potential concerns for this device in the Deep Impact application. SET causing the 2.5V output of this device to exceed 3V may potentially damage the 54SX32S. Three samples were de-lidded at BATC to expose the LT1085 die for heavy ion testing, and these devices were mounted on separate test boards fabricated by Tetsuo Miyahira, JPL. Two devices were exposed at the BNL Brookhaven Tandem Van de Graaff Heavy Ion facility. No SEL or was observed up to the maximum exposure LET: 84.5 MeV/mg/sqcm while simulating the Deep Impact bias and load application. SETs were observed exceeding 3V peak amplitude under certain load conditions. The following documents the SEE test results for this device.
Omnirel Low Dropout Regulator OMR186SRM Single Event Transient (SET) and Latchup (SEL) Test Results for the MSS, Deep Impact & Calipso Programs July 11, 2002 di_pa_rel_032_omr186.pdf di_pa_rel_032_omr186.doc	*Introduction* The Omnirel Low Dropout Regulator OMR186SRM (OM135335RX is an OMR186SRM with added screening) is planned for use as a +2.5V bias for the 54SX32S FPGAs on the Deep Impact program. This Omnirel device is a hermetic packaged Linear Technologies LT1086 die. Single Event Transient (SET was identified as potential concerns for this device in the Deep Impact application. SET causing the 2.5V output of this device to exceed 3V may potentially damage the 54SX32S. Three samples were de-lidded at BATC to expose the LT1086 die for heavy ion testing, and these devices were mounted on separate test boards fabricated by Tetsuo Miyahira, JPL. Three devices were exposed at the BNL Brookhaven Tandem Van de Graaff Heavy Ion facility. No SEL or was observed up to the maximum exposure LET: 84.5 MeV/mg/sqcm while simulating the Deep Impact bias and load application. SET peak amplitudes were observed exceeding 3V under certain load conditions. The following documents the SEE test results for this device.
LM3940.pdf	Test report on the National Semiconductor LM3940. (Added March 18, 2002. External link).
regulator_3volt.PDF RegulationVsDoseRun1.pdf InputCurrentVsDoseRun1.pdf LM2931CTVinVsVoutVsDoseRun1.pdf LM1117T3p3VinVsVoutVsDoseRun1.pdf	Load Circuit for LM1117T3.3 and LM2931CT LVDO Regulators Regulation vs. Dose @ 2.84 rad(Si) / min Input current vs. Dose Vin vs. Vout vs. Dose for the LM2931CT Vin vs. Vout vs. Dose for the LM11173.3
LM1117T-3.3_BNL0499.htm	LM1117T-3.3 Heavy Ion Test, Brookhaven National Labs, April, 1999.
Proton_Test_1.htm	LM1117T3.3 and LM2931CT LVDO Regulators Proton Test, Summer 1999.

LVDO Regulator Vendors

WWW Site	Technology Description	Technical Contact
M.S. Kennedy :: RAD Hard Line
Home Page for Hi-Rel They have the following sections: Rad Tolerant, Fixed Rad Tolerant, Adjustable Rad Hard, Fixed Rad Hard, Adjustable I couldn't make the links work, their www page was too fancy. Sorry. DSCC Standardized Military Drawings / MIL-S-19500 / QPL / JTX / JTXV	OmniRel: Unit of International Rectifier. Power semiconductors.

Home - NASA Office of Logic Design
Last Revised: January 06, 2006
Digital Engineering Institute
Web Grunt: Richard Katz

NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

Low Voltage Dropout Regulators and DC-DC Converters

Read This!

Applications_Notes

Some_Radiation_Test_Results

LVDO_Regulator_Vendors

Applications Notes

Some Radiation Test Results

LVDO Regulator Vendors

WWW Site

Technology Description

Technical Contact

NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems, with a view to their practical solution.

Low Voltage Dropout Regulators and DC-DC Converters

Read This!

Applications_Notes

Some_Radiation_Test_Results

LVDO_Regulator_Vendors

Applications Notes

Some Radiation Test Results

LVDO Regulator Vendors

WWW Site

Technology Description

Technical Contact

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.