2006 MAPLD International Conference
Ronald Reagan Building and International Trade Center
with a session at the Smithsonian National Air and Space Museum
September 26-28, 2006
Member of Technical Staff
Jet Propulsion Laboratory
Gary received his B.S. in engineering physics from the University of Oklahoma in 1975 and did his graduate work in nuclear engineering at the University of Illinois at Urbana-Champaign.
Subsequently, he joined the Jet Propulsion Laboratory in 1991 and is a Principle Member of the Radiation Effects Group of the Electronic Parts Engineering Office.
Gary has published more than 20 refereed papers, including work on dielectric rupture in commercial DRAMs and field-programmable gate arrays used on spacecraft. He has a broad range of single event, total dose and dosimetry interests with particular emphasis on efficient radiation screening of commercial microelectronics for space applications, microdosimeters, mitigation techniques for radiation effects in space, and understanding the physical mechanisms of radiation effects in emerging microelectronics. Gary and other group members received the JPL/NASA Excellence Award in 1998. They also received the Outstanding Paper Award at the 1999 Nuclear and Space Radiation Effects Conference for their paper entitled "Angular and Energy Dependence of Proton Upset in Optocouplers" which explained how direct ionization from protons increases the upset rate in optocouplers.
Seminars: 2006 MAPLD International Conference
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