NASA Office of Logic Design

NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.


2005 MAPLD International Conference

Ronald Reagan Building and International Trade Center
Washington, D.C.

September 6, 2005

Device Failure Modes and Reliability

Seminar Leaders:

Abstract

This seminar will concentrate on digital integrated circuits and packages for high reliability electronics.  The two major topics to be covered are device failure modes and reliability.  Case studies of specific failures and lessons learned will be given.

Logistics

Seminar Schedule

Seminar Outline


Seminars: 2005 MAPLD International Conference


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Last Revised: February 03, 2010
Digital Engineering Institute
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