NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

2005 MAPLD International Conference

Ronald Reagan Building and International Trade Center
Washington, D.C.

September 6, 2005

Device Failure Modes and Reliability

Seminar Leaders:

• Andrew D. Kostic, Ph.D.
• Yuan Chen, NASA Jet Propulsion Laboratory
• Keith Rogers, CALCE Electronic Products and Systems Center at the University of Maryland
• Dr. Henning W. Leidecker, Jr., NASA Goddard Space Flight Center
• Daniel K. Elftmann, Director Product Engineering, Actel Corporation
• and more ...

Abstract

This seminar will concentrate on digital integrated circuits and packages for high reliability electronics.  The two major topics to be covered are device failure modes and reliability.  Case studies of specific failures and lessons learned will be given.

Logistics

• Location: Hemisphere B

• Time: 9:00 am to 5:30 pm.

Seminar Schedule

• Start:   9:00 am
• Break:  10:30 am to 10:45 am
• Lunch:  12:30 pm to  1:30 pm
• Break:   3:30 pm to  3:45 pm
• End:     5:30 pm

Seminar Outline

• Basic Reliability
  • Bathtub curve and Causes
    • Infant mortality
    • Random failures
    • Wearout
  • Arrehenius Equation
  • Accelerated Testing
  • Overview of Failure Distributions
  • Failure Mechanisms and Related Equations
• Present FA tools and Techniques
• Future Reliability and FA challenges
• Roundtable Discussion

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Seminars: 2005 MAPLD International Conference

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